#scanning probe

Discarded AFM tips.

Atomic Force Microscopy, or AFM, is a technique by which a small mechanical probe is scanned across a sample to create a height map. This technique has very high resolution, less than a nanometer, depending on what kind of tip is being used, and can be done in ambient conditions (no need for vacuum). AFM is useful for getting roughness data and measuring film thickness, and can be combined with other microscopy techniques to get a complete picture of your device.

AFM probes often get damaged or dirty, resulting in “tip graveyards” like the one shown here.